Time-of-flight mass spectrometry

Results: 251



#Item
11Microsoft PowerPoint - ASMS07Poster-Wenzel2slide2.pptx

Microsoft PowerPoint - ASMS07Poster-Wenzel2slide2.pptx

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Source URL: www.covalx.com

Language: English - Date: 2010-01-31 12:33:06
12MOTion Apparatus Design Considerations Christian Schneider (), Group of Eric Hudson, Department of Physics and Astronomy, UCLA RF Trap The dimensions of the RF trap probably

MOTion Apparatus Design Considerations Christian Schneider (), Group of Eric Hudson, Department of Physics and Astronomy, UCLA RF Trap The dimensions of the RF trap probably

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Source URL: chschneider.eu

Language: English - Date: 2015-11-02 00:21:58
13Submicron aerosol composition measurements during ACRIDICON-CHUVA: Indications for secondary organic aerosol formation in the upper tropical troposphere March 1, 2016 ACRIDICON-CHUVA Workshop

Submicron aerosol composition measurements during ACRIDICON-CHUVA: Indications for secondary organic aerosol formation in the upper tropical troposphere March 1, 2016 ACRIDICON-CHUVA Workshop

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Source URL: chuvaproject.cptec.inpe.br

Language: English - Date: 2016-03-01 15:57:22
14Proceedings of the 49th ASMS Conference on Mass Spectrometry and Allied Topics, Chicago, Illinois, May 27-31, 2001  High through put analysis of MALDI time-of-flight MS/MS and LCMS/MS data. Richard J. Jacob1, Peter R. Ba

Proceedings of the 49th ASMS Conference on Mass Spectrometry and Allied Topics, Chicago, Illinois, May 27-31, 2001 High through put analysis of MALDI time-of-flight MS/MS and LCMS/MS data. Richard J. Jacob1, Peter R. Ba

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Source URL: prospector.ucsf.edu

Language: English - Date: 2010-08-28 02:04:02
    15Technical News ●TOF-SIMS によるガラス表面の広領域マッピング TN407  Wide Area Mapping of Glass Surface by Time-of-Flight Secondary Ion Mass Spectrometry

    Technical News ●TOF-SIMS によるガラス表面の広領域マッピング TN407 Wide Area Mapping of Glass Surface by Time-of-Flight Secondary Ion Mass Spectrometry

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    Source URL: www.scas.co.jp

    Language: Japanese - Date: 2013-04-10 09:58:12
      16Technical News ●飛行時間型二次イオン質量分析法(TOF-SIMS) TN060 Time of Flight Secondary Ion Mass Spectrometry (TOF-SIMS)

      Technical News ●飛行時間型二次イオン質量分析法(TOF-SIMS) TN060 Time of Flight Secondary Ion Mass Spectrometry (TOF-SIMS)

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      Source URL: www.scas.co.jp

      Language: Japanese - Date: 2014-07-14 04:43:07
        17Worksheet for Exploration 25.4: Time-of-Flight Mass Spectrometer Positively charged particles start in the center of a uniform electric field (created by the charged gray plates; the field is shown, but fringe effects ar

        Worksheet for Exploration 25.4: Time-of-Flight Mass Spectrometer Positively charged particles start in the center of a uniform electric field (created by the charged gray plates; the field is shown, but fringe effects ar

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        Source URL: www.compadre.org

        Language: English - Date: 2013-05-21 23:30:52
        18Atmos. Meas. Tech., 8, 2333–2345, 2015 www.atmos-meas-tech.netdoi:amt © Author(sCC Attribution 3.0 License.  Statistical precision of the intensities retrieved from constraine

        Atmos. Meas. Tech., 8, 2333–2345, 2015 www.atmos-meas-tech.netdoi:amt © Author(sCC Attribution 3.0 License. Statistical precision of the intensities retrieved from constraine

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        Source URL: www.atmos-meas-tech.net

        Language: English - Date: 2015-06-05 09:52:42
        19MassBank User’s Manual Version 2.3, 9 December 2010 Copyright© JST-BIRD MassBank

        MassBank User’s Manual Version 2.3, 9 December 2010 Copyright© JST-BIRD MassBank

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        Source URL: msbi.ipb-halle.de

        Language: English - Date: 2010-12-09 00:32:01
        20Microsoft Word - nlsep2005.doc

        Microsoft Word - nlsep2005.doc

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        Source URL: www.barc.gov.in

        Language: English - Date: 2012-08-10 06:17:43